ARC Consortium: William & Mary
Lab Equipment and Apparatus - Surface Characterization Lab II (L121)
Dektak 3 ST Surface Profiler
Extremely accurate high precision surface measurement system
Analytical functions include parameters for: roughness, waviness, step height, and geometry
Available Styli include:
- Sub-micro
- 2.5 m
- 12.5 m
- 25 m
Dektak Technical Specifications
Return to Lab 121 detail page.