ARC Consortium: William & Mary
Lab Equipment and Apparatus - Surface Characterization Lab II (L121)
Scanning Tunneling Microscope (STM)
About the easyScan STM:
STM (Scanning Tunneling Microscopy) is a scanning
probe microscope that utilizes a circuit that adjusts the
height of the tip according to current variations that are
dependent upon surface deviations. STM identifies a
change in voltage as a result of the tip distance from
the surface. This difference equates to an image that
displays surface variations.
Operation Modes:
- Constant Height: the tip probes the surface in a straight
line and at the same time the tunneling current is
recorded
- Constant Current: the tip probes the surface so that the tunneling current is kept constant by the controller. The change in tip height is recorded
Software:
Image Metrology's Scanning Probe Image Processor contains many analytical
and visualization tools, including Fourier Imaging, force curve analysis,
roughness analysis, tip characterization, and 3D visualization.
Return to Lab 121 detail page.