ARC Consortium: William & Mary
Employee Information - Surface Characterization Lab II (L121)
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Christine "Dee Dee" Hopkins Graduate Student, Applied Science College of William and Mary Department of Applied Sciences Applied Research Center Lab 123 phone: (757)269-5723 |
Work Interests
My general area of interest involves surface characterization techniques, more specifically research related to ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) and its current/potential biomolecular applications. Currently, I am involved in research using ToF-SIMS as a means for quantitative analysis. Additionally, I am interested in biological surface interactions and the identification of biomolecules relevant to disease detection and prognosis.
Characterization Techniques:
- Zeiss Axiolab Transmitted & Reflected Light Microscope
- Dektak3ST Surface Profiler
- E-Pure Deionized Water System
- Hitatchi S-570 Scanning Electron Microscope
- Energy Dispersive X-Ray Spectroscopy (EDS)
- Scanning Probe Microscope (SPM) Specifications
- Atomic Force Microscopy (AFM)
- Scanning Tunneling Microscopy (STM)
- Shimadzu-Vickers Microhardness Tester Type M
- Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Contact information:
E-Mail: cdhopk@wm.edu
Phone: (757)269-5723
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