ARC Consortium: William & Mary
Lab Equipment and Apparatus - Surface Characterization Lab I (L123)
Scanning Probe Microscope
Microscopy Techniques used in Material Characterization Lab:
- Atomic Force
- Tapping Mode (Instructional Guide)
- Contact Mode
- Non-Contact Mode
- Fluid Cell
- Electric Force
- Scanning Tunneling
- Magnetic Force
- Nanoindentor
Return to Lab 123 detail page.