Accelerator Seminar: Jonathan Angle

  • Accelerator Seminar: Jonathan Angle
    2021-01-14EST11:00:00 ~ 2021-01-14EST12:00:00
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Speaker: Jonathan Angle

Improved SIMS Operation and Quantification for N-Doped Niobium

Abstract: Over the last decade, Secondary Ion Mass Spectrometry (SIMS) has become an increasingly important characterization tool for the SRF field. Early successes, such as Q/A checks for vendor supplied niobium, utilized methods which reported 40% uncertainty in instrument calibration. With attention moving to producing high Q0/ high gradient cavities, a more robust method for nitrogen determination was developed. Now reporting calibration uncertainties of ~10%, our focus shifts to using SIMS to compare doping recipes, quantify the effects of contamination, and better understand the diffusion behavior of nitrogen in niobium.

Event Date
Contact Name
Gianluigi Ciovati