Accelerator Seminar: Jonathan Angle
- Accelerator Seminar: Jonathan Anglehttps://www.jlab.org/accelerator/seminarshttps://bluejeans.com/1168010372021-01-14EST11:00:00 ~ 2021-01-14EST12:00:0014727
Speaker: Jonathan Angle
Improved SIMS Operation and Quantification for N-Doped Niobium
Abstract: Over the last decade, Secondary Ion Mass Spectrometry (SIMS) has become an increasingly important characterization tool for the SRF field. Early successes, such as Q/A checks for vendor supplied niobium, utilized methods which reported 40% uncertainty in instrument calibration. With attention moving to producing high Q0/ high gradient cavities, a more robust method for nitrogen determination was developed. Now reporting calibration uncertainties of ~10%, our focus shifts to using SIMS to compare doping recipes, quantify the effects of contamination, and better understand the diffusion behavior of nitrogen in niobium.