Accelerator Seminar: Jonathan Angle

  • Accelerator Seminar: Jonathan Angle
    https://www.jlab.org/accelerator/seminars
    https://bluejeans.com/116801037
    2021-01-14EST11:00:00 ~ 2021-01-14EST12:00:00
    14727
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Speaker: Jonathan Angle

Improved SIMS Operation and Quantification for N-Doped Niobium

Abstract: Over the last decade, Secondary Ion Mass Spectrometry (SIMS) has become an increasingly important characterization tool for the SRF field. Early successes, such as Q/A checks for vendor supplied niobium, utilized methods which reported 40% uncertainty in instrument calibration. With attention moving to producing high Q0/ high gradient cavities, a more robust method for nitrogen determination was developed. Now reporting calibration uncertainties of ~10%, our focus shifts to using SIMS to compare doping recipes, quantify the effects of contamination, and better understand the diffusion behavior of nitrogen in niobium.


Event Date
-
Location
https://bluejeans.com/116801037
Category
SCIENTIFIC PROGRAM
Seminars
Contact Name
Gianluigi Ciovati
Phone
757-269-6330